Non-contact strain measurement using DIC on a micro tensile sampleThe strain distribution on a micro tensile sample is measured using the Q400 DIC system. The initial sample length is 4mm. The measurement is carried out with macro lenses. The displacement resolution of a DIC system depends linearly on the image field and the camera resolution. Example: With 12MPixel cameras, displacements from 100nm (or 10nm) can be resolved at an image field of 40x30mm (or 4x3mm). DIC measurements with image fields smaller than 1mm² can be achieved with the Q400-µDIC system (stereo microscope). This application example shows the ability of the Q400 system to measure the 3D deformation of very small components even with standard makro optics. |